11.3
Device Characterization Using AFP Nanoprobing for the Localization of New Product Design Weakness

Thursday, November 7, 2013: 10:05 AM
Meeting Room 230A (San Jose McEnery Convention Center)
Mr. Ang Ghim Boon , GLOBALFOUNDRIES Singapore Pte Ltd, Singapore, Singapore
Dr. Alfred C.T. Quah , GLOBALFOUNDRIES Singapore, Singapore, Singapore

See more of: Session 11: Nanoprobing and Nanoscale Electrical Failure Analysis
See more of: Symposium