39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)
November 03 - 07, 2013
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1.1
Pump Probe Imaging of Integrated Circuits
Monday, November 4, 2013: 10:00 AM
Meeting Room 230AB (San Jose McEnery Convention Center)
Dr. David Stoker
,
SRI International, Menlo Park, CA
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Session 1: Emerging Concepts and Techniques
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