39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)
November 03 - 07, 2013
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9.5
32nm CMOS SOI Test Site for Emission Tool Evaluation
Wednesday, November 6, 2013: 10:55 AM
Meeting Room 230B (San Jose McEnery Convention Center)
Mr. Alan J. Weger
,
IBM T.J. Watson Research Center, Yorktown Heights, NY
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Session 9: Photon Based Techniques - 1
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