9.3
Scan Shift Debug Using LVI Phase Mapping
Scan Shift Debug Using LVI Phase Mapping
Wednesday, November 6, 2013: 10:05 AM
Meeting Room 230B (San Jose McEnery Convention Center)
Summary:
Laser Voltage Imaging (LVI) has become a well-established method for isolating scan shift or chain integrity tests failures. This paper introduces a novel LVI methodology that incorporates phase information . Application cases showing fault isolation of Scan Shift failure are also presented.
Laser Voltage Imaging (LVI) has become a well-established method for isolating scan shift or chain integrity tests failures. This paper introduces a novel LVI methodology that incorporates phase information . Application cases showing fault isolation of Scan Shift failure are also presented.