39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)
November 03 - 07, 2013
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Yield Basics for Failure Analysts
Sunday, November 3, 2013: 8:00 AM
Meeting Room 230B (San Jose McEnery Convention Center)
Mr. Dave Albert
,
IBM, Hopewell Junction, NY
Mr. Tracy Myers
,
ON Semiconductor, Gresham, OR
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