Electrical and Yield

Sunday, November 3, 2013: 8:00 AM-12:15 PM

Meeting Room 230B (San Jose McEnery Convention Center)

Session Chairs:

Dr. Felix Beaudoin and Dr. Jenny Ma

8:00 AM

Yield Basics for Failure Analysts
Mr. Dave Albert, IBM; Mr. Tracy Myers, ON Semiconductor

9:00 AM

Testing Small Technology Nodes in 2, 2.5, 3, and 5.5D
Dr. Martin Keim, Mentor Graphics

10:00 AM

Break

10:15 AM

The Role of Nano-Probing in Yield and Failure Analysis
Mr. Randal E. Mulder, Silicon Labs

11:15 AM

Counterfeit Electronics - Risks and Mitigation
Mr. Bhanu P. Sood, CALCE, University of Maryland

12:15 PM

Lunch

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