39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)
November 03 - 07, 2013
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8.2
Backside Deprocessing for Bulk Silicon Devices
Wednesday, November 6, 2013: 9:25 AM
Meeting Room 230A (San Jose McEnery Convention Center)
Mr. Maozhe Samuel Wei
,
Advanced Micro Devices (Singapore) Pte Ltd, Singapore, Singapore
Ms. Lauren Blair
,
Advanced Micro Devices Ptd Ltd, Austin, TX
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Session 8: Sample Preparation and Device Deprocessing - 1
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