39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)
November 03 - 07, 2013
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Counterfeit Electronics - Risks and Mitigation
Sunday, November 3, 2013: 11:15 AM
Meeting Room 230B (San Jose McEnery Convention Center)
Mr. Bhanu P. Sood
,
CALCE, University of Maryland, College Park, MD
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Electrical and Yield
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