Dr. Felix Beaudoin
Dr. Felix Beaudoin
IBM
Functional Characterization
2070 Route 52
Hopewell Junction,
NY
USA
NY 12533
Papers:
3.1
Early Inline Detection of Systematic Defects Using ATPG & Commonality Analysis On Product-Like Logic Yield Learning Vehicle
5.3
Failure Analysis for SRAM Logic Type Failures
7.2
Gate Leakage Characterization and Fail Mode Analysis On 20 Nm Technology Parametric Test Structures