39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)

November 03 - 07, 2013

Mr. Pariyarathu Salimon Limin

Globalfoundries Singapore Pte. Ltd.
Technology Development-New Technology Prototyping
Globalfoundries Singapore Pte. Ltd., 60 Woodlands Industrial Park D Street 2,
Singapore 738406.
Singapore Singapore 738406

Papers:
10.4 Surface Treatment for 20nm SRAM Devices to Overcome Tip Curvature Radius Limitation in Conductive AFM Analysis 10.7 Study of Static Noise Margin and Circuit Analysis On Advanced Technology Node SRAM Devices By Nanoprobing