Mr. Satish Kodali
Mr. Satish Kodali
GLOBALFOUNDRIES
2070 Route 52
Hopewell Junction,
NY
USA
12533
Papers:
7.2
Gate Leakage Characterization and Fail Mode Analysis On 20 Nm Technology Parametric Test Structures
FA Technique Selection for Front End Defect Localization in Bulk Semiconductor (Si) FA