Mr. Philippe Rousseille

Freescale Semiconducteurs France SAS, Toulouse
Quality
Avenue du Général Eisenhower
134
Toulouse France 31023

Papers:
10.13 Failure Localization of An Electrical Transient Behavior On a Mixed-Mode IC By Using Static Emission Microscopy Technique 12.3 Fault Localization of Metal Defects With Si-CCD Camera in Analog Device Functional Failure