Mr. Boon Lian Yeoh
Mr. Boon Lian Yeoh
B.E
GLOBALFOUNDRIES
Technology Development- New Technology Prototyping
60 Woodlands Industrial Park D Street 2
Singapore
Singapore
738406
Papers:
3.2
Evolution of Wafer Level Tester- Based Diagnostic System: More Than Just a Dynamic Electrical Fault Isolation Tool
9.7
Optimization of Soft Defect Localization Technique Scan Time Using Dummy Subroutine Test Vector Insertion
11.9
Nanoprobing As An Essential and Fast Methodology in Identification of Failure's Root Cause for Advanced Technology