39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013): http://www.asminternational.org/content/Events/istfa/

39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)
November 03 - 07, 2013

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Mr. Steve Brockett

TriQuint Semiconductor, Inc.
2300 NE Brookwood Parkway
Hillsboro, OR
USA 97124

Papers:
5.10 Conversion of a D-Mode FET to An E-Mode FET Via Electrostatic Discharge in a GaAs Power Amplifier Duplexer Module 5.12 Marginal RF Gain Investigation and Root Cause Determination

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General Information

November 03 - 07, 2013


San Jose, CA