39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013): http://www.asminternational.org/content/Events/istfa/

39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)
November 03 - 07, 2013

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Mr. Yan Li

GLOBALFOUNDRIES Singapore
QRA-FA
60 Woodlands Industrial Park D, Street 2, Singapore 738406
Singapore Singapore 738406

Papers:
10.17 High Resolution C-Mode Scanning Acoustic Microscope Techniques for the Failure Analysis of Microelectronic Packages 11.12 Applications of Nanoprobing for Localization of Design for Manufacturing Issues On Analogue-to-Digital Converter On Advanced Technology Node

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General Information

November 03 - 07, 2013


San Jose, CA