39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013): http://www.asminternational.org/content/Events/istfa/

39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)
November 03 - 07, 2013

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Sung Joo Hong

SK hynix
2091, 215,Daesin-ro
Cheongju South Korea KS001

Papers:
10.12 Simple and Effective Technique of Backside De-Processing of Thin Flip Chip Package 11.10 Failure Analysis Due to Slightly Unetched Hard Mask Using Nano Probe

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General Information

November 03 - 07, 2013


San Jose, CA