Technology Specific FA

Sunday, November 3, 2013: 1:15 PM-6:30 PM
Meeting Room 230B (San Jose McEnery Convention Center)
Session Chairs:
Mr. Jeremy A. Walraven and Mr. Mark Jenkins
1:15 PM
Emerging Failure Modes of Advanced Technology
Mr. Terence Kane, IBM
2:15 PM
LEDs Inside and Out
Dr. Martine Simard-Normandin, MuAnalysis Inc.
3:15 PM
Diagnosing Analog Circuit Failures
Mr. Elvis Cooper, Analog Devices, Inc.
4:15 PM
Break
4:30 PM
Introduction to Microelectromechanical Systems (MEMS)
Mr. Jeremy A. Walraven, Sandia National Labs
5:30 PM
Electrostatic Discharge in Robotic Manufacturing Lines: Electrostatic Basics, ESD-Failure Mechanisms, Tool Risk Evaluation Methods and ESD- vs EOS-Classification and Characterization Methods
Prof. Peter Jacob, EMPA Duebendorf (50%, 1993-today, Main Affiliation)
See more of: Tutorial
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