39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013): http://www.asminternational.org/content/Events/istfa/

39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)
November 03 - 07, 2013

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Nanoprobing User Group

Thursday, November 7, 2013: 4:30 PM-6:30 PM
Meeting Room 230A (San Jose McEnery Convention Center)
4:30 PM
A Prober Shuttle with 27 Axes, Stephan Kleindiek, Kleindiek Nanotechnik, GmbH
5:00 PM
Semi-Automated Defect Localization using AFP PicoCurrent, Sean Zumwalt, Multiprobe
5:30 PM
Nanoprobe to TEM-A Case Study, Winfield Scott, Evans Analytical Group
6:00 PM
Using Recipes for Increased Throughput in Memory Probing Applications, Jason Jones, DCG Nano Instruments
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General Information

November 03 - 07, 2013


San Jose, CA