Electrical and Yield

Thursday, November 7, 2013: 8:00 AM-9:00 AM
Meeting Room 230A (San Jose McEnery Convention Center)
Session Chairs:
Dr. Felix Beaudoin and Dr. Jenny Ma
8:00 AM
Test Fundamentals and Implementation of Wafer Level Tester-Based Failure Analysis
Dr. SH Goh, GLOBALFOUNDRIES
See more of: Tutorial
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