39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013): http://www.asminternational.org/content/Events/istfa/

39th International Symposium for Testing and Failure Analysis (November 3 – 7, 2013)
November 03 - 07, 2013

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Sample Prep / 3D Package User Group

Wednesday, November 6, 2013: 5:30 PM-7:30 PM
Meeting Room 230B (San Jose McEnery Convention Center)
5:30 PM
Ion Milling: What can it do for FA?, Becky Holdford, Texas Instruments
6:00 PM
FA Applications of 3D X-Ray, Kevin Weaver, Texas Instruments
6:30 PM
3D X-Ray Computer Tomography – A Powerful FA Tool, Evstatin Krastev, Nordson Dage
7:00 PM
The Use of Laser Decapsulation Tools to Remove Glass Lids from Optical Ceramic Packages, Carl Nail, Evans Analytical Group, LLC
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General Information

November 03 - 07, 2013


San Jose, CA