Spectrum Sharpening on Rotation Averaged TEM Nano Beam Electron Diffraction Patterns
Spectrum Sharpening on Rotation Averaged TEM Nano Beam Electron Diffraction Patterns
Tuesday, November 11, 2014: 8:25 AM
310 B (George R. Brown Convention Center )
Summary:
In this work, we have applied the Maximum-Likelihood deconvolution method on the rotation averaged TEM diffraction pattern spectrum for peak sharpening.We have demonstrated by case studies that this method is very effective to improve the accuracy of the nano beam electron diffraction method. Phase identification and strain analysis can then be done more precisely in the nano meter scale.
In this work, we have applied the Maximum-Likelihood deconvolution method on the rotation averaged TEM diffraction pattern spectrum for peak sharpening.We have demonstrated by case studies that this method is very effective to improve the accuracy of the nano beam electron diffraction method. Phase identification and strain analysis can then be done more precisely in the nano meter scale.