Symposium

Monday, November 10, 2014

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8:00 AM-9:40 AM


Plenary Session
Session Chair: Mr. Dan Bodoh

9:55 AM-11:15 AM


Emerging Concepts and Techniques
Session Chair: Dr. Michael Bruce and Dr. Huimeng Wu

11:15 AM-12:05 PM


Novel Research-Level Techniques and Concepts
Session Chair: Dr. Michael Bruce and Dr. Huimeng Wu

1:00 PM-1:25 PM


Detecting Counterfeit Devices
Session Chair: Dr. Zhigang Song

1:00 PM-2:40 PM


3D Packages I
Session Chair: Mr. Frank Altmann and Dr. Yan Li

1:25 PM-2:40 PM


Photon-Based Techniques I
Session Chair: Dr. Frank Zachariasse and Dr. Herve Deslandes

2:50 PM-4:05 PM


Packaging and Assembly Analysis I
Session Chair: Dr. Lihong Cao

Photon-Based Techniques II
Session Chair: Dr. Frank Zachariasse and Dr. Herve Deslandes

4:05 PM-6:00 PM


Contactless User Group

7:00 PM-9:00 PM


Social Event

Tuesday, November 11, 2014

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8:00 AM-9:15 AM


Microscopy I
Session Chair: Mr. Carl Nail

8:00 AM-9:40 AM


3D Packages II
Session Chair: Mr. Frank Altmann and Dr. Yan Li

9:55 AM-12:00 PM


Electrical Characterization and Nanoprobing
Session Chair: Dr. Stefan B. Kaemmer and Mr. Izak Kapilevich

Packaging and Assembly Analysis II
Session Chair: Dr. Lihong Cao

12:20 PM-2:20 PM


Nanoprobing User Group

2:35 PM-3:50 PM


Packaging and Assembly Analysis III
Session Chair: Dr. Lihong Cao

2:35 PM-4:40 PM


Case Studies and the Failure Analysis Process I
Session Chair: Dr. Zhigang Song and Prof. Peter Jacob

4:00 PM-6:00 PM


Expo Networking Reception

Wednesday, November 12, 2014

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10:15 AM-12:15 PM


Panel Discussion: System to Component Level Failure Analysis in Space & Oil industries
Session Chair: Dr. Felix Beaudoin

1:30 PM-3:30 PM


Posters
Session Chair: Dr. Martin Versen and Mr. David Grosjean

3:30 PM-4:20 PM


Circuit Edit
Session Chair: Mr. Dane Scott and Dr. Michael DiBattista

3:30 PM-5:35 PM


Sample Preparation and Device Deprocessing I
Session Chair: Mr. Roger Alvis and Mr. Bryan Tracy

4:20 PM-6:00 PM


Microscopy II
Session Chair: Mr. Carl Nail

Thursday, November 13, 2014

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8:00 AM-9:40 AM


Case Studies and the Failure Analysis Process II
Session Chair: Dr. Zhigang Song and Prof. Peter Jacob

Sample Preparation and Device Deprocessing II
Session Chair: Mr. Roger Alvis and Mr. Bryan Tracy

9:50 AM-11:30 AM


Defect Characterization and Metrology
Session Chair: Mr. Phil Kaszuba and Mr. Terence Kane

9:50 AM-11:55 AM


Sample Preparation and Device Deprocessing III
Session Chair: Mr. Roger Alvis and Mr. Bryan Tracy

12:20 PM-2:20 PM


Sample Prep User Group

2:30 PM-3:20 PM


Sample Preparation and Device Deprocessing IV
Session Chair: Mr. Roger Alvis and Mr. Bryan Tracy

2:30 PM-3:45 PM


Software-Based Techniques, Test, Diagnosis, and Yield
Session Chair: Mr. Geir Eide and Mr. Mark E. Kimball

3:45 PM-5:45 PM


FIB User Group