40th International Symposium for Testing and Failure Analysis (ISTFA 2014)
November 09 - 13, 2014
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Yield Basics for FA
Sunday, November 9, 2014: 8:00 AM
310 B (George R. Brown Convention Center )
Mr. Dave Albert
,
IBM, Hopewell Junction, NY
Mr. Tracy Myers
,
ON Semiconductor, Gresham, OR
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Yield Basics for FA Tutorial
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Tutorial