Tutorial

Sunday, November 9, 2014

Sunday | Wednesday | top

8:00 AM-9:00 AM


Chip Scale Packaging and Its Failure Analysis Challenges Tutorial
Session Chair: Mr. Jake E. Klein and Mr. Robert Champaign

Yield Basics for FA Tutorial
Session Chair: Dr. Jenny Ma and Dr. Mayue Xie

9:00 AM-10:00 AM


Beam-Based Defect Localization Tutorial
Session Chair: Ms. Susan Li and Mr. Gregory M. Johnson

SAM vs X-RAY Tutorial
Session Chair: Mr. Jake E. Klein and Mr. Robert Champaign

Testing Small Technology Nodes in 2, 2.5, 3, and 5.5D Tutorial
Session Chair: Dr. Jenny Ma and Dr. Mayue Xie

10:15 AM-11:15 AM


Flip-Chip and Backside Techniques Tutorial
Session Chair: Mr. Jake E. Klein and Mr. Robert Champaign

Photonic Localization Techniques Tutorial
Session Chair: Ms. Susan Li and Mr. Gregory M. Johnson

The Role of Nanoprobing in Yield and Failure Analysis Tutorial
Session Chair: Dr. Jenny Ma and Dr. Mayue Xie

11:15 AM-12:15 PM


Laser Induced Techniques for Microelectronic Failure Analysis: SDL and LADA Tutorial
Session Chair: Ms. Susan Li and Mr. Gregory M. Johnson

Test Fundamentals and Implementation of Wafer Level Tester-Based Failure Analysis Tutorial
Session Chair: Dr. Jenny Ma and Dr. Mayue Xie

12:15 PM-1:15 PM


Defect localization by Lock-in-Thermography Tutorial
Session Chair: Ms. Susan Li and Mr. Gregory M. Johnson

1:15 PM-2:15 PM


Scanning Electron Microscopy Tutorial
Session Chair: Mr. Carl Nail and Ms. Rose Ring

2:15 PM-3:15 PM


Emerging Failure Modes of Advanced Technology Tutorial
Session Chair: Mr. Jeremy A. Walraven and Mr. Chris Richardson

Magnetic Imaging for Die and Package Fault Isolation Tutorial
Session Chair: Ms. Susan Li and Mr. Gregory M. Johnson

Transmission Electron Microscopy Tutorial
Session Chair: Mr. Carl Nail and Ms. Rose Ring

3:15 PM-4:15 PM


FA Technique Selection for Front End Defect Localization in Bulk Semiconductor (Si) FA Tutorial
Session Chair: Ms. Susan Li and Mr. Gregory M. Johnson

Failure Anamnesis (be)for(e) Failure Analysis Tutorial
Session Chair: Mr. Jeremy A. Walraven and Mr. Chris Richardson

Ultra-High Resolution in the SEM Tutorial
Session Chair: Mr. Carl Nail and Ms. Rose Ring

4:30 PM-5:30 PM


Focused Ion Beam (FIB) for Circuit Edit, Fault Isolation and Sample Preparation Tutorial
Session Chair: Mr. Carl Nail and Ms. Rose Ring

5:30 PM-6:30 PM


Materials Characterization for Failure Analysis Tutorial
Session Chair: Mr. Carl Nail and Ms. Rose Ring

Wednesday, November 12, 2014

Sunday | Wednesday | top

8:00 AM-10:00 AM


Oil & Gas Microelectronics Failure Analysis: Methodologies and Selected Case Studies Tutorial
Session Chair: Mr. Jeremy A. Walraven

9:00 AM-10:00 AM


Fundamentals of Laser Signal Injection Microscopy
Session Chair: Ms. Susan Li and Mr. Gregory M. Johnson