Dr. Jian-Shing Luo

Department manager
Inotera Memories, Inc.
Physical Failure Analysis Department
Hwa-Ya Technology Park 667, Fuhsing 3rd Rd., Kueishan
Taoyuan Taiwan 33383

Papers:
To Eliminate Curtain Effect of FIB TEM Samples by a Combination of Sample Dicing and Backside Milling