To Eliminate Curtain Effect of FIB TEM Samples by a Combination of Sample Dicing and Backside Milling

Wednesday, November 12, 2014
Exhibit Hall B3 (George R. Brown Convention Center )
Dr. Jian-Shing Luo , Inotera Memories, Inc., Taoyuan, Taiwan
Ms. Hsiu-Ting Lee , Inotera Memories, Inc., Taoyuan, Taiwan

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