Ms. Hsiu-Ting Lee
Ms. Hsiu-Ting Lee
engineer
Inotera Memories, Inc.
Physical Failure Analysis Department
Hwa-Ya Technology Park 667, Fuhsing 3rd Rd., Kueishan
Taoyuan
Taiwan
33383
Papers:
To Eliminate Curtain Effect of FIB TEM Samples by a Combination of Sample Dicing and Backside Milling