Mr. Pariyarathu Salimon Limin

Globalfoundries Singapore Pte. Ltd.
New Technology Prototyping, Technology Development and Research
60 Woodlands Industrial Park D Street 2
Singapore Singapore 738406

Papers:
Utilizing Nanoprobing and Circuit Diagnostics to Identify Key Failure Mechanism of Otherwise Non-Visible Defects in 20nm Logic Devices Application of Fast Laser Deprocessing Techniques in Physical Failure Analysis on SRAM Memory of Advance Technology