Dr. SH Goh

Phd
GLOBALFOUNDRIES
Technology Development- New Technology Prototyping
60 Woodlands Industrial Park D Street 2
Singapore Singapore 738406

Papers:
Application of Soft Defect Localization (SDL) for SRAM Soft Failure Debug Debugging Phase Locked Loop Failures in Integrated Circuit Products Test Fundamentals and Implementation of Wafer Level Tester-Based Failure Analysis