40th International Symposium for Testing and Failure Analysis (ISTFA 2014): http://www.asminternational.org/content/Events/istfa/

40th International Symposium for Testing and Failure Analysis (ISTFA 2014)
November 09 - 13, 2014

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Dr. Yamin Huang

GLOBALFOUNDRIES Singapore Pte Ltd
60 Woodlands Industrial Park D STREET 2
Singapore Singapore 738406

Papers:
Investigation of Protection Layer Materials for Ex-situ 'lift-out' TEM sample Preparation Technique with FIB for 14nm FinFET Application of Fast Laser Deprocessing Techniques in Physical Failure Analysis on SRAM Memory of Advance Technology

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General Information

November 09 - 13, 2014


Houston, TX