40th International Symposium for Testing and Failure Analysis (ISTFA 2014)

November 09 - 13, 2014

Mr. Hieu Nguyen

Staff Engineer
Qualcomm Technologies, Inc.
5751 PACIFIC CENTER BLVD
BUILDING W-210Q
San Diego, CA
USA 92121

Papers:
Application of Passive Voltage Contrast (PVC) to DualBeam Focused Ion Beam (FIB) Based Sample Preparation for the Scanning/Transmission Electron Microscope (S/TEM)