Application of Passive Voltage Contrast (PVC) to DualBeam Focused Ion Beam (FIB) Based Sample Preparation for the Scanning/Transmission Electron Microscope (S/TEM)

Thursday, November 13, 2014: 10:40 AM
310 A (George R. Brown Convention Center )
Mr. Corey Senowitz , Qualcomm Technologies, Inc., San Diego, CA
Ms. Theresa Graupera , Qualcomm Technologies, Inc., San Diego, CA
Mr. Don Lyons , Qualcomm Technologies, Inc., San Diego, CA
Mr. Hieu Nguyen , Qualcomm Technologies, Inc., San Diego, CA
Ms. Ruby Vollrath , Qualcomm Technologies, Inc., San Diego, CA
Dr. Michael DiBattista , Qualcomm Technologies, Inc., San Diego, CA

See more of: Sample Preparation and Device Deprocessing III
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