Test Fundamentals and Implementation of Wafer Level Tester-Based Failure Analysis Tutorial

Sunday, November 9, 2014: 11:15 AM-12:15 PM
310 B (George R. Brown Convention Center )
Session Chairs:
Dr. Jenny Ma and Dr. Mayue Xie
11:15 AM
Test Fundamentals and Implementation of Wafer Level Tester-Based Failure Analysis
Dr. SH Goh, GLOBALFOUNDRIES
12:15 PM
Lunch
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