FA Technique Selection for Front End Defect Localization in Bulk Semiconductor (Si) FA Tutorial

Sunday, November 9, 2014: 3:15 PM-4:15 PM

310 C (George R. Brown Convention Center )

Session Chairs:

Ms. Susan Li and Mr. Gregory M. Johnson

3:15 PM

FA Technique Selection for Front End Defect Localization in Bulk Semiconductor (Si) FA
Mr. Gregory M. Johnson, IBM; Mr. Christopher D'Aleo, IBM

4:15 PM

Break

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