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Electrically-enhanced LADA (EeLADA) Technique
Electrically-enhanced LADA (EeLADA) Technique
Monday, November 2, 2015: 9:55 AM
Meeting Room D135 & 136 (Oregon Convention Center )
Summary:
We demonstrate the necessary use of pulsed-LADA in lieu of conventional CW-LADA for advanced integrated circuits soft defect fault localization. It is shown that a pulse width and frequency in the range of microseconds and 10 KHz is sufficient to enhance OBIC effects. This paper also introduces a new enhanced LADA-based fault localization technique called Electrically-enhanced LADA (EeLADA) which is capable to extract only critical signals that are relevant to the failure observed on test.
We demonstrate the necessary use of pulsed-LADA in lieu of conventional CW-LADA for advanced integrated circuits soft defect fault localization. It is shown that a pulse width and frequency in the range of microseconds and 10 KHz is sufficient to enhance OBIC effects. This paper also introduces a new enhanced LADA-based fault localization technique called Electrically-enhanced LADA (EeLADA) which is capable to extract only critical signals that are relevant to the failure observed on test.