41st International Symposium for Testing and Failure Analysis (November 1 - 5, 2015)
November 01 - 05, 2015
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Technical Program
Refreshment Break
Monday, November 2, 2015
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Monday
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Tuesday
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Wednesday
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Thursday
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8:00 AM-9:10 AM
Opening Session
9:10 AM-9:30 AM
Refreshment Break
9:30 AM-10:45 AM
1
Emerging FA Techniques and Concepts
Session Chair: Mr. Terence Kane and Mr. Phil Kaszuba
10:45 AM-12:00 PM
2
Fault Isolation I
Session Chair: Dr. Michael Bruce and Dr. Paiboon Tangyunyong
12:00 PM-1:00 PM
Monday Lunch
1:00 PM-1:50 PM
3
Scanning Probe Analysis
Session Chair: Mr. Phil Kaszuba and Mr. Terence Kane
1:00 PM-2:15 PM
4
FIB Sample Preparation
Session Chair: Dr. Tom Schamp and Mr. Carl Nail
1:50 PM-3:30 PM
5
Fault Isolation II
Session Chair: Dr. Michael Bruce and Dr. Paiboon Tangyunyong
2:15 PM-3:30 PM
6
FIB Circuit Analysis and Edit
Session Chair: Dr. Michael DiBattista and Mr. Jason M. Benz, BS/MS Microelectronic Eng & Materials Science
3:30 PM-3:40 PM
Refreshment Break
3:40 PM-5:40 PM
Contactless Fault Isolation User Group
FIB User Group
5:00 PM-6:00 PM
Tools of the Trade Tour *Separate Registration Required
7:00 PM-9:30 PM
Off-Site Social Event - Punch Bowl Social
Tuesday, November 3, 2015
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Monday
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Tuesday
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Wednesday
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Thursday
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9:00 AM-10:30 AM
Plenary Session
10:30 AM-11:10 AM
Refreshment Break
11:10 AM-12:00 PM
7
Board and System Level FA
Session Chair: Mr. Ted Kolasa and Ms. Victoria Bruce
8
Microscopy
Session Chair: Mr. Carl Nail and Dr. Tom Schamp
12:00 PM-1:30 PM
Tuesday Lunch
1:30 PM-2:55 PM
Refresh & Energize Break
2:55 PM-4:05 PM
9
3D Devices Failure Analysis I
Session Chair: Mr. Frank Altmann and Dr. Yan Li
2:55 PM-5:00 PM
10
Detecting Counterfeit Microelectronics I
Session Chair: Mr. Robert Champaign and Mr. Joe Colangelo
5:00 PM-6:40 PM
Expo Welcome Reception
Wednesday, November 4, 2015
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Monday
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Tuesday
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Wednesday
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Thursday
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8:00 AM-8:50 AM
11
Metrology and In-line Device Characterization
Session Chair: Mr. Bryan Tracy and Dr. Huimeng Wu
9:30 AM-10:30 AM
Refreshment Break
10:10 AM-12:10 PM
Panel Discussion - 1st Silicon Debug: Rapid Identification and Correction of Product Systematic Failures
Session Chair: Mr. Tracy Myers
12:10 PM-1:30 PM
EDFAS Luncheon and General Membership Meeting
1:30 PM-3:30 PM
22
3D Devices Failure Analysis - Poster
Session Chair: Mr. Frank Altmann and Dr. Yan Li
23
Case Studies and FA Process - Posters
Session Chair: Dr. Zhigang Song and Ms. Rose Ring
24
Device FA - Posters
Session Chair: Mr. Ted Kolasa and Ms. Victoria Bruce
25
Emerging FA Techniques and Concepts - Poster
Session Chair: Mr. Phil Kaszuba and Mr. Terence Kane
26
FA Lab Management - Posters
Session Chair: Dr. Zhigang Song and Ms. Rose Ring
27
Fault Isolation - Posters
Session Chair: Dr. Michael Bruce and Dr. Paiboon Tangyunyong
28
FIB Circuit Analysis and Edit - Poster
Session Chair: Mr. Jason M. Benz, BS/MS Microelectronic Eng & Materials Science and Dr. Michael DiBattista
29
Metrology and In-line Characterization - Posters
Session Chair: Mr. Bryan Tracy and Dr. Huimeng Wu
30
Microscopy - Posters
Session Chair: Mr. Carl Nail and Dr. Tom Schamp
31
Student Posters
Session Chair: Mr. Kent Erington and Mr. Randal E. Mulder
32
Packaging and Assembly Level FA - Posters
Session Chair: Dr. Lihong Cao and Mr. Bhanu P. Sood
33
Sample Preparation and Device Deprocessing - Posters
Session Chair: Mr. Roger Alvis and Mr. Jake E. Klein
34
Scanning Probe Analysis - Posters
Session Chair: Mr. Phil Kaszuba and Mr. Terence Kane
Exhibitor Dessert Reception
3:30 PM-4:45 PM
12
3D Device Failure Analysis II
Session Chair: Dr. Yan Li and Mr. Frank Altmann
13
Diagnostic Testing, Scanning and Debug
Session Chair: Mr. Geir Eide and Mr. Mark E. Kimball
4:45 PM-6:00 PM
14
Detecting Counterfeit Microelectronics II
Session Chair: Mr. Robert Champaign and Mr. Joe Colangelo
15
Device FA
Session Chair: Ms. Victoria Bruce and Mr. Ted Kolasa
Thursday, November 5, 2015
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Monday
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Tuesday
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Wednesday
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Thursday
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8:00 AM-10:05 AM
16
Nanoprobing and Electrical Characterization
Session Chair: Mr. Randal E. Mulder and Mr. Kent Erington
9:00 AM-10:15 AM
17
Packaging and Assembly Level FA I
Session Chair: Dr. Lihong Cao and Mr. Bhanu P. Sood
10:05 AM-10:25 AM
Refreshment Break
10:25 AM-11:40 AM
18
Packaging and Assembly Level FA II
Session Chair: Mr. Bhanu P. Sood and Dr. Lihong Cao
19
Sample Preparation and Device Deprocessing I
Session Chair: Mr. Izak Kapilevich and Dr. Sam Subramanian
11:40 AM-12:40 PM
Thursday Lunch
12:40 PM-1:55 PM
20
Sample Preparation and Device Deprocessing II
Session Chair: Mr. Jake E. Klein and Mr. Roger Alvis
12:40 PM-2:20 PM
21
Case Studies and FA Process
Session Chair: Dr. Zhigang Song and Mrs. Rose Ring
1:55 PM-2:30 PM
Refreshment Break
2:05 PM-4:05 PM
Sample Prep / 3D Package Prep User Group
2:30 PM-4:30 PM
NanoProbing User Group