1.3
Laser Logic State Imaging Using Transient Voltage Collapse Circuits

Monday, November 2, 2015: 10:20 AM
Meeting Room D135 & 136 (Oregon Convention Center )
Dr. Gwanghyeon Baek , Intel Corporation, Hillsboro, OR
Dr. John Keane , Intel Corporation, Hillsboro, OR
Dr. Martin von Haartman , Intel Corporation, Hillsboro, OR

Summary:

We successfully demonstrated laser based logic state imaging (LLSI) by utilizing transient voltage collapse circuits of SRAM blocks. From this experiment, it is concluded that the additional circuit or experimental setup, such as droop inducers or an accurate AC power supply, is not mandatory for LLSI.