41st International Symposium for Testing and Failure Analysis (November 1 - 5, 2015)
November 01 - 05, 2015
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Flip-Chip and Backside Techniques
Sunday, November 1, 2015: 9:00 AM
Meeting Room D139 & 140 (Oregon Convention Center )
Dr. Edward I. Cole Jr.
,
Sandia National Laboratories, Albuquerque, NM
Dr. Daniel L. Barton
,
Sandia National Laboratories, Albuquerque, NM
Dr. Karoline Bernhard-Hofer
,
Infineon, Regensburg, Germany
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Package and Physical Analysis Challenges
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