Focused Ion Beam (FIB) for Circuit Edit, Fault Isolation and Sample Preparation
Sunday, November 1, 2015: 12:30 PM
Meeting Room D139 & 140 (Oregon Convention Center )
Mr. Steven B. Herschbein
,
Globalfoundries, Hopewell Junction, NY
Mr. Carmelo F. Scrudato
,
Globalfoundries, Hopewell Junction, NY
Mr. George K. Worth
,
Globalfoundries, Hopewell Junction, NY
Mr. Edward S. Hermann
,
Globalfoundries, Hopewell Junction, NY
Dr. Shida Tan
,
Intel Corporation, Santa Clara, CA
Mr. Chris Scheffler
,
Intel Corporation, Santa Clara, CA
Mr. Richard Livengood
,
Intel Corporation, Santa Clara, CA
Mr. Oleg Sidorov
,
FEI Company, Hillsboro, OR
