Microscopy

Sunday, November 1, 2015: 12:30 PM-5:30 PM
Meeting Room D139 & 140 (Oregon Convention Center )
Session Chairs:  Mr. Jake E. Klein, Quality, Texas Instruments, Tucson, AZ and Mr. Carl Nail, Failure Analysis Services, MTE Division, Evans Analytical Group, LLC, Irvine, CA
12:30 PM
Focused Ion Beam (FIB) for Circuit Edit, Fault Isolation and Sample Preparation
Mr. Steven B. Herschbein, Globalfoundries; Mr. Carmelo F. Scrudato, Globalfoundries; Mr. George K. Worth, Globalfoundries; Mr. Edward S. Hermann, Globalfoundries; Dr. Shida Tan, Intel Corporation; Mr. Chris Scheffler, Intel Corporation; Mr. Richard Livengood, Intel Corporation; Mr. Oleg Sidorov, FEI Company
2:00 PM
Scanning Electron Microscopy and Materials Analysis
Dr. William E. Vanderlinde, Intelligence Advanced Research Projects Activity
3:30 PM
Break
4:00 PM
Transmission Electron Microsocpy
Dr. Sam Subramanian, Freescale Semiconductor, Inc.
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