Mr. Kristopher D. Staller

Principal Failure Analysis Engineer
Texas Instruments
Tucson Device Analysis Operations Laboratory
5411 E. Williams Blvd
Mail Stop 5034
Tucson, AZ
USA 85711

Papers:
20.2 Decapsulation of Multi-Chip BOAC Devices with Exposed Copper Metallization Using Atmospheric Pressure Microwave Induced Plasma