Mr. Gregory M. Johnson

Advisory Engineer
GLOBALFOUNDRIES
Physical Failure Analysis
2070 Route 52
IBM East Fishkill B/334 Column K-15
Hopewell Junction, NY
USA 12533

Papers:
5.4 Device Ioff Mapping: Analysis of Ring Oscillator by Optical Beam Induced Resistance Change FA technique selection for front end defect localization in bulk semiconductor (Si) FA