5.4
Device Ioff Mapping: Analysis of Ring Oscillator by Optical Beam Induced Resistance Change
Device Ioff Mapping: Analysis of Ring Oscillator by Optical Beam Induced Resistance Change
Monday, November 2, 2015: 3:05 PM
Meeting Room D139 & 140 (Oregon Convention Center )
Summary:
This paper explores the use of static fault isolation techniques in debugging dynamic systems like a ring oscillator, and offers and explanation of the signals generated in OBIRCH.
This paper explores the use of static fault isolation techniques in debugging dynamic systems like a ring oscillator, and offers and explanation of the signals generated in OBIRCH.