5.4
Device Ioff Mapping: Analysis of Ring Oscillator by Optical Beam Induced Resistance Change

Monday, November 2, 2015: 3:05 PM
Meeting Room D139 & 140 (Oregon Convention Center )
Mr. Gregory M. Johnson , GLOBALFOUNDRIES, Hopewell Junction, NY
Mr. Christopher D'Aleo , IBM, Hopewell Junction, NY
Dr. Ziyan Xu , IBM, Hopewell Junction, NY

Summary:

This paper explores the use of static fault isolation techniques in debugging dynamic systems like a ring oscillator, and offers and explanation of the signals generated in OBIRCH.
See more of: Fault Isolation II
See more of: Technical Program