41st International Symposium for Testing and Failure Analysis (November 1 - 5, 2015)

November 01 - 05, 2015

Mr. Chris Scheffler

Senior Staff Engineer
Intel Corporation
2200 Mission College Blvd
Santa Clara, CA
USA 95054-8080

Papers:
Focused Ion Beam (FIB) for Circuit Edit, Fault Isolation and Sample Preparation