41st International Symposium for Testing and Failure Analysis (November 1 - 5, 2015)

November 01 - 05, 2015

Mr. Martin Igarashi

VP of Semiconductor Business
TeraView Limited
Platinum Building
St John's Innovation Park
Cambridge United Kingdom CB4 oWS

Papers:
9.2 Fast Feature Based Non-Destructive Fault Isolation in 3D IC Packages Utilizing Virtual Known Good Device