41st International Symposium for Testing and Failure Analysis (November 1 - 5, 2015)

November 01 - 05, 2015

Dr. Michael DiBattista

Qualcomm, Inc.
5751 PACIFIC CENTER BLVD
BUILDING W-135A
San Diego, CA
USA 92121

Papers:
19.2 Adaptive Grinding and Polishing of Silicon Integrated Circuits to Ultrathin Remaining Thickness