41st International Symposium for Testing and Failure Analysis (November 1 - 5, 2015)

November 01 - 05, 2015

Mr. Dominique CARISETTI

Engineer
Thales Research and Technology
1 rue Augustin Fresnel
Palaiseau France 91767

Papers:
27.1 IR Thermography for Temperature Measurements and Fault Location on AlGaN/GaN HEMTs and MMICs