27.1
IR Thermography for Temperature Measurements and Fault Location on AlGaN/GaN HEMTs and MMICs
Wednesday, November 4, 2015
Exhibit Hall D (Oregon Convention Center )
Mr. Leny BACZKOWSKI
,
Thales Airborne Systems, Elancourt, France
Mr. Dominique CARISETTI
,
Thales Research and Technology, Palaiseau, France
Dr. Laurent BRUNEL
,
United Monolithic Semiconductors, Villebon-sur-Yvette, France
Mr. Franck VOUZELAUD
,
Thales Airborne Systems, Elancourt, France
Prof. Christophe GAQUIERE
,
IEMN, Villeneuve d’Ascq, France
Dr. Benoit LAMBERT
,
United Monolithic Semiconductors, Villebon-sur-Yvette, France
Dr. Nicolas SARAZIN
,
Thales Research and Technology, Palaiseau, France
Mr. Jean-Claude CLEMENT
,
Thales Research and Technology, Palaiseau, France
