41st International Symposium for Testing and Failure Analysis (November 1 - 5, 2015)

November 01 - 05, 2015

Dr. Allen Gu

Applications Manager
Carl Zeiss X-ray Microscopy
Applications
4385 Hopyard Rd, Suite 100
Pleasanton, CA
USA 94588

Papers:
17.3 X-ray Microscopy and Root Cause Analysis in Electronic Packaging