41st International Symposium for Testing and Failure Analysis (November 1 - 5, 2015)

November 01 - 05, 2015

Mr. Edward S. Hermann

Globalfoundries
Hudson Valley Research Park
2070 Rt 52, B/300 MS-4A1
Hopewell Junction, NY
USA 12533

Papers:
Focused Ion Beam (FIB) for Circuit Edit, Fault Isolation and Sample Preparation